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X ray emission spectrometry, electron microscopic
[ɪlˈɛktɹɒn mˌa͡ɪkɹəskˈɒpɪk], [ɪlˈɛktɹɒn mˌaɪkɹəskˈɒpɪk], [ɪ_l_ˈɛ_k_t_ɹ_ɒ_n m_ˌaɪ_k_ɹ_ə_s_k_ˈɒ_p_ɪ_k] [ˈɛks ɹˈe͡ɪ ɪmˈɪʃən spɛktɹˈɒmətɹɪ] [ˈɛks ɹˈeɪ ɪmˈɪʃən spɛktɹˈɒmətɹɪ] [ˈɛ_k_s ɹ_ˈeɪ ɪ_m_ˈɪ_ʃ_ə_n s_p_ɛ_k_t_ɹ_ˈɒ_m_ə_t_ɹ_ɪ]
Definitions of X Ray Emission Spectrometry, Electron Microscopic
Identification and measurement of concentration of elements based on the fact that primary- emission x- rays emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It may be performed by an electron probe microanalyzer, an electron microscope microanalyzer, or by an electron microscope, or scanning electron microscope, fitted with an x- ray spectrometer.