X RAY EMISSION SPECTROMETRY, ELECTRON MICROSCOPIC
\ˈɛks ɹˈe͡ɪ ɪmˈɪʃən spɛktɹˈɒmətɹi], \ˈɛks ɹˈeɪ ɪmˈɪʃən spɛktɹˈɒmətɹi], \ˈɛ_k_s ɹ_ˈeɪ ɪ_m_ˈɪ_ʃ_ə_n s_p_ɛ_k_t_ɹ_ˈɒ_m_ə_t_ɹ_i]\
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Identification and measurement of concentration of elements based on the fact that primary-emission x-rays emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It may be performed by an electron probe microanalyzer, an electron microscope microanalyzer, or by an electron microscope, or scanning electron microscope, fitted with an x-ray spectrometer.
By DataStellar Co., Ltd
Nearby Words
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