ATOMIC FORCE MICROSCOPIES
\ɐtˈɒmɪk fˈɔːs mˈa͡ɪkɹəskəpɪz], \ɐtˈɒmɪk fˈɔːs mˈaɪkɹəskəpɪz], \ɐ_t_ˈɒ_m_ɪ_k f_ˈɔː_s m_ˈaɪ_k_ɹ_ə_s_k_ə_p_ɪ_z]\
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A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
By DataStellar Co., Ltd
